Freebase is currently in read-only mode

Topic

Created by victoriavanduyne on 3/31/2012

Atomic Absorption Monitor for Deposition Process Control of Aluminum at 394 nm using Frequency-Doubled Diode Laser ^en

mid: /m/0j6l1zl notable type: /book/written_work notable for: /book/written_work

Types:

Add type

Metaweb System Types

Object

Common

Topic

Freebase

Object profile

Media

Written Work

VisLeg

Labeled

Object is not asserted on this topic.

ID /type/object/id

GUID /type/object/guid

#9202a8c04000641f80000000206907d2

Type /type/object/type

Name /type/object/name

- - Edit
  - Delete
Atomic Absorption Monitor for Deposition Process Control of Aluminum at 394 nm using Frequency-Doubled Diode Laser

Key /type/object/key

Timestamp /type/object/timestamp

Saturday, March 31, 2012 12:35 AM

Permission /type/object/permission

/boot/all_permission

Creator /type/object/creator

victoriavanduyne

Attribution /type/object/attribution

victoriavanduyne

Search /type/object/search

Machine ID /type/object/mid

/m/0j6l1zl

Also known as /common/topic/alias

Description /common/topic/description

Image /common/topic/image

Official website /common/topic/official_website

Topic equivalent webpage /common/topic/topic_equivalent_webpage

Social media presence /common/topic/social_media_presence

Topical webpage /common/topic/topical_webpage

- - Edit
  - Delete
http://www.stanford.edu/group/fejer/fejerpubs/1996/90.pdf

Subjects /common/topic/subjects

Subject of /common/topic/subject_of

Web Link(s) (deprecated) /common/topic/webpage

-

Properties /common/topic/properties

Article /common/topic/article

Weblink /common/topic/weblink

Notable for /common/topic/notable_for

Written Work

Notable types /common/topic/notable_types

Written Work
Labeled

Object profile is not asserted on this topic. Assert type now.

Object generation time /freebase/object_profile/object_generation_time

- - Edit
  - Delete
Thursday, May 23, 2013 10:45 PM

Link count /freebase/object_profile/link_count

Author /book/written_work/author

Editor /book/written_work/editor

Date written /book/written_work/date_written

Date of first publication /book/written_work/date_of_first_publication

- - Edit
  - Delete
1996

Subjects /book/written_work/subjects

Original language /book/written_work/original_language

Online versions /book/written_work/online_versions

-

School or Movement /book/written_work/school_or_movement

Part of series /book/written_work/part_of_series

Previous in series /book/written_work/previous_in_series

Next in series /book/written_work/next_in_series

ISFDB ID /book/written_work/isfdb_id

Translations /book/written_work/translations

Subject topics /base/visleg/labeled/subject_topics

Subject keywords /base/visleg/labeled/subject

- - Edit
  - Delete
VLfeatured

Comments

Hide

Atomic Absorption Monitor for Deposition Process Control of Aluminum at 394 nm using Frequency-Doubled Diode Laser ^en

Add type

Metaweb System Types

Common

Freebase

Media

VisLeg

Freebase Commons Metaweb System Types /type

Object /type/object

Freebase Commons Common /common

Topic /common/topic x

Freebase Commons Freebase /freebase

Object profile /freebase/object_profile

Freebase Commons Media /media_common

Written Work /book/written_work x

User Domain VisLeg /base/visleg

Labeled /base/visleg/labeled x

Comments

Atomic Absorption Monitor for Deposition Process Control of Aluminum at 394 nm using Frequency-Doubled Diode Laser en

Freebase Commons Metaweb System Types /type

Freebase Commons Common /common

Freebase Commons Freebase /freebase

Freebase Commons Media /media_common

User Domain VisLeg /base/visleg

Keyboard Shortcuts

Navigation

Editing

Comments

Wait!

Wait!

Atomic Absorption Monitor for Deposition Process Control of Aluminum at 394 nm using Frequency-Doubled Diode Laser ^en